Controlling the thickness and orientation of hole-selective self-assembled monolayers (SAMs) has long posed a challenge in the field of perovskite-based solar cells. In our most recent publication, we employ in situ angle-resolved X-ray photoelectron spectroscopy to examine the impact of annealing temperature on the thickness and orientation of the prototypical 2PACz. Our results demonstrate that increasing the annealing temperature beyond the typical range of 100°C to 150°C leads to a decrease in SAM thickness from approximately 5 nm to 1 nm, while simultaneously improving its packing density. As a result, the interfacial passivation quality of the 2PACz/perovskite layer is enhanced, thereby improving the performance of fully-textured perovskite-silicon tandem solar cells.
https://doi.org/10.1002/smtd.202401758
The Borchert Lab 